Hybrid AI and Computer Vision Framework for PCB/SMD Defect Detection with GUI-Enabled IoT Deployment

Publié le 12 juin 2026 - 2026 IEEE 3rd International Conference on Big Data Science and Engineering (ICBDSE)

Auteurs : Ata Jahangir Moshayedi, Dong Haoren, Amir Sohail Khan, S.Ali Eftikhari, Ming Jun Zhang, David Bassir