Optimisation of Inelastic X-ray Scattering imaging parameters for the study of artists' pigments

Inelastic X-ray scattering (IXS) is a powerful method for studying materials. It is preferable to reduce the irradiation time in order to preserve the samples as much as possible, which can affect the interpretation of the data. We propose a statistical approach to optimise the experimental parameters in order to make the most of a given collection time.